Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Centered pyramids
Brigger, P.; Muller, F.; Illgner, K.; Unser, M.
Image Processing, IEEE Transactions on
Volume 8, Issue 9, Sep 1999 Page(s):1254 - 1264
Digital Object Identifier   10.1109/83.784437
Summary:Quadtree-like pyramids have the advantage of re-suiting in a multiresolution representation where each pyramid node has four unambiguous parents. Such a centered topology guarantees a clearly defined up-projection of labels. This concept has been successfully and extensively used in applications of contour detection, object recognition and segmentation. Unfortunately, the quadtree-like type of pyramid has poor approximation powers because of the employed piecewise-constant image model. This paper deals with the construction of improved centered image pyramids in terms of general approximation functions. The advantages of the centered topology such a symmetry, consistent boundary conditions and accurate up-projection of labels are combined with a more faithful image representation at coarser pyramid levels. We start by introducing a general framework for the design of least squares pyramids using the standard filtering and decimation tools. We give the most general explicit formulas for the computation of the filter coefficients by any (well behaving) approximation function in both the continuous (L2) and the discrete (l2) norm. We then define centered pyramids and provide the filter coefficients for odd spline approximation functions. Finally, we compare the centered pyramid to the ordinary one and highlight some applications

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved