BIST-based delay-fault testing in FPGAs
Abramovici, M.; Stroud, C.
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Volume , Issue , 2002 Page(s): 131 - 134
Digital Object Identifier   10.1109/OLT.2002.1030195
Summary: We present the first delay-fault testing approach for FPGAs, applicable both for manufacturing and for on-line testing. Our approach is based on BIST, is comprehensive, and does not require expensive ATE. We have successfully implemented this BIST approach on the ORCA 2C series FPGA.

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