Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Analog-to-digital converters
Bin Le; Rondeau, T.W.; Reed, J.H.; Bostian, C.W.
Signal Processing Magazine, IEEE
Volume 22, Issue 6, Nov. 2005 Page(s): 69 - 77
Digital Object Identifier   10.1109/MSP.2005.1550190
Summary: This paper analyzed the internal relationships of the performance parameters of ADCs, showing their frequency dependency and structure dependency. The history and current trends in ADC technologies based on the P and F figures-of-merit were also reviewed. Historically, there was an increase in performance around 1994, with a share rise around 1997, which broke the stagnant performance discussed by Waiden (1999). While the past few years have shown a sharp increase in ADC performance, we have shown that performance and power dissipation depend greatly on the ADC structure and the target applications. With the progression of wideband radio systems like UWB and OFDM comes a growing demand to provide faster sampling rates and higher resolutions with lower power dissipation. With the innovation of advanced communication techniques like multi-input/multi-output and multistandard radios, the demand is growing to provide multichannel programmable data conversion, both of which are pushing the performance of ADCs further in the coming years.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved