Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Distributed EM algorithms for density estimation and clustering in sensor networks
Nowak, R.D.
Signal Processing, IEEE Transactions on
Volume 51, Issue 8, Aug. 2003 Page(s): 2245 - 2253
Digital Object Identifier   10.1109/TSP.2003.814623
Summary: The paper considers the problem of density estimation and clustering in distributed sensor networks. It is assumed that each node in the network senses an environment that can be described as a mixture of some elementary conditions. The measurements are thus statistically modeled with a mixture of Gaussians, where each Gaussian component corresponds to one of the elementary conditions. The paper presents a distributed expectation-maximization (EM) algorithm for estimating the Gaussian components, which are common to the environment and sensor network as a whole, as well as the mixing probabilities that may vary from node to node. The algorithm produces an estimate (in terms of a Gaussian mixture approximation) of the density of the sensor data without requiring the data to be transmitted to and processed at a central location. Alternatively, the algorithm can be viewed as a distributed processing strategy for clustering the sensor data into components corresponding to predominant environmental features sensed by the network. The convergence of the distributed EM algorithm is investigated, and simulations demonstrate the potential of this approach to sensor network data analysis.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved