Surface morphology of (Hg,Re)Ba2CaCu2Oy thin films prepared by pulsed laser deposition
Su, J.H.; Sastry, P.V.P.S.S.; Schwartz, J.
Applied Superconductivity, IEEE Transactions on
Volume 13, Issue 2, June 2003 Page(s): 2809 - 2812
Digital Object Identifier 10.1109/TASC.2003.812011
Summary:(Hg,Re)Ba2CaCu2Oy thin films have been fabricated on [100] LaAlO3 by reacting laser deposited Re0.2Ba2CaCu2Oy precursor films with CaHgO2 in sealed quartz tubes at 780°C for times ranging between 0 h -16 h. The films reacted for more than 2 h exhibit high phase purity (Hg,Re)-1212 and good c-axis texture. Scanning electron microscopy and x-ray diffraction studies showed the existence of small amounts of a-axis oriented grains in all the reacted films. The root-mean-square roughness, measured by atomic force microscopy (AFM), increases initially with increase in heat treatment duration and saturates at ∼300 nm after 4 h. The evolution of the surface roughness can be partially explained with a high nucleation density and the appearance of a three-dimensional structure during the initial stages of film growth and crystal coalescence at further growth. Two-dimensional planar growth with a one-unit-cell growth unit in the c direction was observed by AFM.
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