Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

A combined decision fusion and channel coding scheme for distributed fault-tolerant classification in wireless sensor networks
Tsang-Yi Wang; Han, Y.S.; Biao Chen; Varshney, P.K.
Wireless Communications, IEEE Transactions on
Volume 5, Issue 7, July 2006 Page(s):1695 - 1705
Digital Object Identifier   10.1109/TWC.2006.1673081
Summary:In this paper, we consider the distributed classification problem in wireless sensor networks. Local decisions made by local sensors, possibly in the presence of faults, are transmitted to a fusion center through fading channels. Classification performance could be degraded due to the errors caused by both sensor faults and fading channels. Integrating channel decoding into the distributed fault-tolerant classification fusion algorithm, we obtain a new fusion rule that combines both soft-decision decoding and local decision rules without introducing any redundancy. The soft decoding scheme is utilized to combat channel fading, while the distributed classification fusion structure using error correcting codes provides good sensor fault-tolerance capability. Asymptotic performance of the proposed approach is also investigated. Performance evaluation of the proposed approach with both sensor faults and fading channel impairments is carried out. These results show that the proposed approach outperforms the system employing the MAP fusion rule designed without regard to sensor faults and the multiclass equal gain combining fusion rule

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved