Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Access control meets public key infrastructure, or: assigning rolesto strangers
Herzberg, A.; Mass, Y.; Mihaeli, J.; Naor, D.; Ravid, Y.
Security and Privacy, 2000. S&P 2000. Proceedings. 2000 IEEE Symposium on
Volume , Issue , 2000 Page(s):2 - 14
Digital Object Identifier   10.1109/SECPRI.2000.848442
Summary:The Internet enables connectivity between many strangers: entities that don't know each other. We present the Trust Policy Language (TPL), used to define the mapping of strangers to predefined business roles, based on certificates issued by third parties. TPL is expressive enough to allow complex policies, e.g. non-monotone (negative) certificates, while being simple enough to allow automated policy checking and processing. Issuers of certificates are either known in advance, or provide sufficient certificates to be considered a trusted authority according to the policy. This allows bottom-up, “grass roots” buildup of trust, as in the real world. We extend, rather than replace, existing role based access control mechanisms. This provides a simple, modular architecture and easy migration from existing systems. Our system automatically collects missing certificates from peer servers. In particular this allows use of standard browsers, which pass only one certificate to the server. We describe our implementation, which can be used as an extension of a Web server or as a separate server with interface to applications

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved