Tracking Uncertainty with Probabilistic Logic Circuit Testing
Krishnaswamy, S.; Markov, I.L.; Hayes, J.P.
Design & Test of Computers, IEEE
Volume 24, Issue 4, July-Aug. 2007 Page(s):312 - 321
Digital Object Identifier   10.1109/MDT.2007.146
Summary:The diverse nature of the faults and defects that may occur at nanoscale ranges necessitates new techniques for ATPG. This article proposes an efficient technique that relies on a probabilistic approach to detect and diagnose nontraditional faults and defects.

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