An industrial evaluation of DRAM tests
van de Goor, A.J.
Design & Test of Computers, IEEE
Volume 21, Issue 5, Sept.-Oct. 2004 Page(s): 430 - 440
Digital Object Identifier   10.1109/MDT.2004.51
Summary:DRAM production tests are currently necessary to reach a defect-per-million level that approaches the single-digit numbers. This implies that a single memory test is insufficient; rather, a set of tests is necessary. This application of 40 well-known memory tests to 1,896 1-Mbyte × 4 DRAM chips, used up to 48 different stress combinations with each test. The results show the importance of selecting the right stress combination, and that the theoretically better tests - those covering more different functional faults - also have higher fault coverage.

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