Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

A tutorial on hidden Markov models and selected applications inspeech recognition
Rabiner, L.R.
Proceedings of the IEEE
Volume 77, Issue 2, Feb 1989 Page(s):257 - 286
Digital Object Identifier   10.1109/5.18626
Summary:This tutorial provides an overview of the basic theory of hidden Markov models (HMMs) as originated by L.E. Baum and T. Petrie (1966) and gives practical details on methods of implementation of the theory along with a description of selected applications of the theory to distinct problems in speech recognition. Results from a number of original sources are combined to provide a single source of acquiring the background required to pursue further this area of research. The author first reviews the theory of discrete Markov chains and shows how the concept of hidden states, where the observation is a probabilistic function of the state, can be used effectively. The theory is illustrated with two simple examples, namely coin-tossing, and the classic balls-in-urns system. Three fundamental problems of HMMs are noted and several practical techniques for solving these problems are given. The various types of HMMs that have been studied, including ergodic as well as left-right models, are described

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved