Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Parallel Distributed Processing of Constrained Skyline Queries by Filtering
Bin Cui; Hua Lu; Quanqing Xu; Lijiang Chen; Yafei Dai; Yongluan Zhou
Data Engineering, 2008. ICDE 2008. IEEE 24th International Conference on
Volume , Issue , 7-12 April 2008 Page(s):546 - 555
Digital Object Identifier   10.1109/ICDE.2008.4497463
Summary:Skyline queries are capable of retrieving interesting points from a large data set according to multiple criteria. Most work on skyline queries so far has assumed a centralized storage, whereas in practice relevant data are often distributed among geographically scattered sites. In this work, we tackle constrained skyline queries in large-scale distributed environments without the assumption of any overlay structures, and propose a novel algorithm named PaDSkyline (Parallel distributed Skyline query processing). PaDSkyline significantly shortens the response time by performing parallel processing over site groups produced by a partition algorithm. Within each group, it locally optimizes the query processing over distributed sites. It also drastically enhances the network transmission efficiency by performing early reduction of skyline candidates with deliberately selected multiple filtering points. Results of extensive experiments demonstrate the efficiency and robustness of our proposals.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved