Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Compact Similarity Joins
Bryan, B.; Eberhardt, F.; Faloutsos, C.
Data Engineering, 2008. ICDE 2008. IEEE 24th International Conference on
Volume , Issue , 7-12 April 2008 Page(s):346 - 355
Digital Object Identifier   10.1109/ICDE.2008.4497443
Summary:Similarity joins have attracted significant interest, with applications in geographical information systems, astronomy, marketing analyzes, and anomaly detection. However, all the past algorithms, although highly fine-tuned, suffer an output explosion if the query range is even moderately large relative to the local data density. Under such circumstances, the response time and the search effort are both almost quadratic in the database size, which is often prohibitive. We solve this problem by providing two algorithms that find a compact representation of the similarity join result, while retaining all the information in the standard join. Our algorithms have the following characteristics: (a) they are at least as fast as the standard similarity join algorithm, and typically much faster, (b) they generate significantly smaller output, (c) they provably lose no information, (d) they scale well to large data sets, and (e) they can be applied to any of the standard tree data structures. Experiments on real and realistic point-sets show that our algorithms are up to several orders of magnitude faster.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved