Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Word-Level Predicate-Abstraction and Refinement Techniques for Verifying RTL Verilog
Jain, H.; Kroening, D.; Sharygina, N.; Clarke, E.M.
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Volume 27, Issue 2, Feb. 2008 Page(s):366 - 379
Digital Object Identifier   10.1109/TCAD.2007.907270
Summary:As a first step, most model checkers used in the hardware industry convert a high-level register-transfer-level (RTL) design into a netlist. However, algorithms that operate at the netlist level are unable to exploit the structure of the higher abstraction levels and, thus, are less scalable. The RTL of a hardware description language such as Verilog is similar to a software program with special features for hardware design such as bit-vector arithmetic and concurrency. This paper uses predicate abstraction, a software verification technique, for verifying RTL Verilog. There are two challenges when applying predicate abstraction to circuits: 1) the computation of the abstract model in presence of a large number of predicates and 2) the discovery of suitable word-level predicates for abstraction refinement. We address the first problem using a technique called predicate clustering. We address the second problem by computing the weakest preconditions of Verilog statements in order to obtain new word-level predicates during abstraction refinement. We compare the performance of our technique with localization reduction, a netlist-level abstraction technique, and report improvements on a set of benchmarks.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved