Longest-path selection for delay test under process variation
Xiang Lu; Zhuo Li; Wangqi Qiu; Walker, D.M.H.; Weiping Shi
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Volume 24, Issue 12, Dec. 2005 Page(s): 1924 - 1929
Digital Object Identifier 10.1109/TCAD.2005.852674
Summary:Under manufacturing process variation, a path through a net is called longest if there exists a process condition under which the path has the maximum delay among all paths through the net. There are often multiple longest paths for each net, due to different process conditions. In addition, a local defect, such as resistive open or a resistive bridge, increases the delay of the affected net. To detect delay faults due to local defects and process variation, it is necessary to test all longest paths through each net. Previous approaches to this problem were inefficient because of the large number of paths that are not longest. This paper presents an efficient method to generate the set of longest paths for delay test under process variation. To capture both structural and process correlation between path delays, we use linear delay functions to express path delays under process variation. A novel technique is proposed to prune paths that are not longest, resulting in a significant reduction in the number of paths. In experiments on International Symposium on Circuits and Systems (ISCAS) circuits, our number of longest paths is 1-6% of the previous best approach, with 300× less running time.
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