Capacitive coupling noise in high-speed VLSI circuits
Heydari, P.; Pedram, M.
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Volume 24, Issue 3, March 2005 Page(s): 478 - 488
Digital Object Identifier   10.1109/TCAD.2004.842798
Summary: Rapid technology scaling along with the continuous increase in the operation frequency cause the crosstalk noise to become a major source of performance degradation in high-speed integrated circuits. This paper presents an efficient metric to estimate the capacitive crosstalk in nanometer high-speed very large scale integration circuits. In particular, we provide closed-form expressions for the peak amplitude, the pulsewidth, and the time-domain waveform of the crosstalk noise. Experimental results show that the maximum error of our noise predictions is less than 13%, while the average error is only 5.82%.

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