Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Comparison of Protection Mechanisms: Capacity Efficiency and Recovery Time
Wensheng He; Somani, A.K.
Communications, 2007. ICC apos;07. IEEE International Conference on
Volume , Issue , 24-28 June 2007 Page(s):2218 - 2223
Digital Object Identifier   10.1109/ICC.2007.373
Summary:High efficiency in capacity utilization and fast restoration are two primary goals of survivable design in optical networks. Shared backup path protection has been shown to be efficient in terms of capacity utilization, due to the sharing of backup capacity. However, sharing of backup capacity also complicates the restoration process, and leads to slow recovery. Ring-type protection in mesh topology, on the other hand, has the advantage of fast restoration. The p-cycle scheme is the most efficient ring-type protection method in terms of capacity utilization. Recently, the concept of pre-cross-connected protection was proposed to increase the recovery speed of shared path protection. We overview these protection methods and their failure recovery processes. The recovery time of these schemes are compared analytically. To compare the capacity efficiency, we formulate integer programming optimization problems for three protection methods in static traffic scenario, considering wavelength continuity constraint. We investigate the effect of network connectivity on the performance of capacity utilization of the methods by experimenting on topologies with different average nodal degrees.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved