Effects of Interactions Between Filter Parasitics and Power Interconnects on EMI Filter Performance
Shuo Wang; van Wyk, J.D.; Lee, F.C.
Industrial Electronics, IEEE Transactions on
Volume 54, Issue 6, Dec. 2007 Page(s):3344 - 3352
Digital Object Identifier   10.1109/TIE.2007.906126
Summary:This paper first analyzes the electrical parameters of differential-mode (DM) and common-mode (CM) propagation on power interconnects. The impedance-transformation effects of the power interconnects are then investigated. The interactions between the parasitic parameters in electromagnetic-interference (EMI) filters and the transformed impedances by the power interconnects are explored in detail. It is found that the interactions can degrade EMI-filter performance at high frequencies. Simulations and experiments are finally carried out to verify the analysis.

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