Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

A Control Method to Charge Series-Connected Ultraelectric Double-Layer Capacitors Suitable for Photovoltaic Generation Systems Combining MPPT Control Method
Nobuyoshi Mutoh; Takayoshi Inoue
Industrial Electronics, IEEE Transactions on
Volume 54, Issue 1, Feb. 2007 Page(s):374 - 383
Digital Object Identifier   10.1109/TIE.2006.885149
Summary:A control method is described to charge series-connected ultraelectric double-layer capacitors (ultra-EDLCs) suitable for photovoltaic generation systems in combination with a maximum power point tracking (MPPT) control method. The EDLC charge control method allows the maximum power acquired by the MPPT control to be quickly charged into series-connected ultra-EDLCs no matter how the weather conditions may change. In the MPPT control, the output current of the solar arrays is controlled so that the output power converges on the maximum power in the prediction line previously determined based on the linearity between the maximum output power and the optimization current. The proportionality coefficient of the prediction line is automatically corrected using the hill-climbing method when the panel temperature of the solar arrays is changed. The EDLC charge control is performed with the three charge modes, i.e., the constant current charge mode, constant power charge mode, and the constant voltage charge mode while supervising the maximum voltage and allowable temperature of each series-connected EDLC. Effectiveness of the methods is verified by simulations and experiments

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved