Multi-scale statistical process monitoring in machining
Xiaoli Li; Xin Yao
Industrial Electronics, IEEE Transactions on
Volume 52, Issue 3, June 2005 Page(s): 924 - 927
Digital Object Identifier   10.1109/TIE.2005.847580
Summary: Most practical industrial process data contain contributions at multiple scales in time and frequency. Unfortunately, conventional statistical process control approaches often detect events at only one scale. This paper addresses a new method, called multiscale statistical process monitoring, for tool condition monitoring in a machining process, which integrates discrete wavelet transform (WT) and statistical process control. Firstly, discrete WT is applied to decompose the collected data from the manufacturing system into uncorrelated components. Next, the detection limits are formed for each decomposed component by using Shewhart control charts. A case study, i.e., tool condition monitoring in turning using an acoustic emission signal, demonstrates that the new method is able to detect abnormal events (serious tool wear or breakage) in the machining process.

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