Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

State-of-the-art, single-phase, active power-factor-correction techniques for high-power applications - an overview
Jovanovic, M.M.; Jang, Y.
Industrial Electronics, IEEE Transactions on
Volume 52, Issue 3, June 2005 Page(s): 701 - 708
Digital Object Identifier   10.1109/TIE.2005.843964
Summary: A review of high-performance, state-of-the-art, active power-factor-correction (PFC) techniques for high-power, single-phase applications is presented. The merits and limitations of several PFC techniques that are used in today's network-server and telecom power supplies to maximize their conversion efficiencies are discussed. These techniques include various zero-voltage-switching and zero-current-switching, active-snubber approaches employed to reduce reverse-recovery-related switching losses, as well as techniques for the minimization of the conduction losses. Finally, the effect of recent advancements in semiconductor technology, primarily silicon-carbide technology, on the performance and design considerations of PFC converters is discussed.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved