Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Hardware-efficient schemes for logarithmic approximation and binary search with application to visibility graph construction
Kei, L.S.; Sridharan, K.; Srikanthan, T.
Industrial Electronics, IEEE Transactions on
Volume 51, Issue 6, Dec. 2004 Page(s): 1346 - 1348
Digital Object Identifier   10.1109/TIE.2004.837892
Summary: Visibility graphs constitute a useful data structure for environment representation in the context of robot path planning. A central element in the construction of the basic visibility graph and its variants is tangent determination. This letter presents new schemes and hardware designs for key elements in tangent construction and identification of obstructed tangents. The designs have been synthesized using Synopsys Design Compiler 2001.08-SP1, and results show they are appropriate for development of a cost-effective and efficient visibility graph generation system.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved