Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Positive output multiple-lift push-pull switched-capacitor Luo-converters
Fang Lin Luo; Hong Ye
Industrial Electronics, IEEE Transactions on
Volume 51, Issue 3, June 2004 Page(s): 594 - 602
Digital Object Identifier   10.1109/TIE.2004.825344
Summary: Micro-power-consumption technique requires high-power-density dc/dc converters and power supply source. Voltage lift technique is a popular method to apply in electronic circuit design. Since a switched capacitor can be integrated into a power IC chip, its size is small. Combining switched-capacitor and voltage lift technique can construct dc/dc converters with small size, high power density, high-voltage transfer gain, high power efficiency, and low electromagnetic interference. This paper introduces a new series of dc/dc converters-positive output multiple-lift push-pull switched-capacitor dc/dc Luo-converters.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved