Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Hardware Agnostic Approach to TPS Life Cycle Sustainment
Oapos;Donnell, S.J.; Krayewsky, M.F.
Autotestcon, 2006 IEEE
Volume , Issue , 18-21 Sept. 2006 Page(s):371 - 375
Digital Object Identifier   10.1109/AUTEST.2006.283689
Summary:Lockheed Martin simulation, training and support (LM-STS) has developed an innovative "hardware agnostic" technical approach to protect the TPS investment from hardware obsolescence. LM-STS developed a set of instrument translators that determine the intent of the legacy TPS call at runtime. Equivalent calls to the LM-STARreg system software are then made to achieve the desired functionality utilizing the new replacement hardware instead of the obsolete legacy hardware. Lockheed Martin missiles and fire controls (LM-MFC) also had requirements to have one set of TPS source code and one set of built TPS that were capable of running legacy and new hardware configurations. Having a controlled set of TPS for the legacy configuration and yet another for the new configuration was deemed too costly and risky. LM-MFC desired to move the TPS from a legacy system to the new system by using intelligent underlying system software capable of performing the appropriate action depending on the hardware configuration. This paper will describe our technical approach to supporting legacy and new hardware configurations via instrument translators without impacting the TPS and present our experience in rehosting LM-MFC TPS utilizing our LM-STARreg system software architecture.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved