Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Model Driven Segmentation of Articulating Humans in Laplacian Eigenspace
Sundaresan, A.; Chellappa, R.
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume 30, Issue 10, Oct. 2008 Page(s):1771 - 1785
Digital Object Identifier   10.1109/TPAMI.2007.70823
Summary:We propose a general approach using Laplacian Eigenmaps and a graphical model of the human body to segment 3D voxel data of humans into different articulated chains. In the bottom-up stage, the voxels are transformed into a high-dimensional (6D or less) Laplacian Eigenspace (LE) of the voxel neighborhood graph. We show that LE is effective at mapping voxels on long articulated chains to nodes on smooth 1D curves that can be easily discriminated, and prove these properties using representative graphs. We fit 1D splines to voxels belonging to different articulated chains such as the limbs, head and trunk, and determine the boundary between splines using the spline fitting error. A top-down probabilistic approach is then used to register the segmented chains, utilizing their mutual connectivity and individual properties. Our approach enables us to deal with complex poses such as those where the limbs form loops. We use the segmentation results to automatically estimate the human body models. While we use human subjects in our experiments, the method is fairly general and can be applied to voxel-based segmentation of any articulated object composed of long chains. We present results on real and synthetic data that illustrate the usefulness of this approach.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved