Clutter invariant ATR
Bitouk, D.; Miller, M.I.; Younes, L.
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume 27, Issue 5, May 2005 Page(s):817 - 821
Digital Object Identifier   10.1109/TPAMI.2005.97
Summary:One of the central problems in automated target recognition is to accommodate the infinite variety of clutter in real military environments. The principle focus of our paper is on the construction of metric spaces where the metric measures the distance between objects of interest invariant to the infinite variety of clutter. Such metrics are formulated using second-order random field models. Our results indicate that this approach significantly improves detection/classification rates of targets in clutter.

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