Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Camera self-calibration from unknown planar structures enforcingthe multiview constraints between collineations
Malis, E.; Cipolla, R.
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume 24, Issue 9, Sep 2002 Page(s): 1268 - 1272
Digital Object Identifier   10.1109/TPAMI.2002.1033217
Summary:In this paper, we describe an efficient method to impose the constraints existing between the collineations between images which can be computed from a sequence of views of a planar structure. These constraints are usually not taken into account by multiview techniques in order not to increase the computational complexity of the algorithms. However, imposing the constraints is very useful since it allows a reduction of geometric errors in the reprojected features and provides a consistent set of collineations which can be used for several applications such as mosaicing, reconstruction, and self-calibration. In order to show the validity of our approach, this paper focus on self-calibration from unknown planar structures proposing a method exploiting the consistent set of collineations. Our method can deal with an arbitrary number of views and an arbitrary number of planes and varying camera internal parameters. However, for simplicity, this papers will only discuss the case with one plane in several views. The results obtained with synthetic and real data are very accurate and stable even when using only few images

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved