Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Bayesian segmentation via asymptotic partition functions
Lanterman, A.D.; Grenander, U.; Miller, M.I.
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume 22, Issue 4, Apr 2000 Page(s):337 - 347
Digital Object Identifier   10.1109/34.845376
Summary:Asymptotic approximations to the partition function of Gaussian random fields are derived. Textures are characterized via Gaussian random fields induced by stochastic difference equations determined by finitely supported, stationary, linear difference operators, adjusted to be nonstationary at the boundaries. It is shown that as the scale of the underlying shape increases, the log-normalizer converges to the integral of the log-spectrum of the operator inducing the random field. Fitting the covariance of the fields amounts to fitting the parameters of the spectrum of the differential operator-induced random field model. Matrix analysis techniques are proposed for handling textures with variable orientation. Examples of texture parameters estimated from training data via asymptotic maximum-likelihood are shown. Isotropic models involving powers of the Laplacian and directional models involving partial derivative mixtures are explored. Parameters are estimated for mitochondria and actin-myocin complexes in electron micrographs and clutter in forward-looking infrared images. Deformable template models are used to infer the shape of mitochondria in electron micrographs, with the asymptotic approximation allowing easy recomputation of the partition function as inference proceeds

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved