Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Simulations of electroporation dynamics and shape deformations in biological cells subjected to high voltage pulses
Joshi, R.P.; Qin Hu; Schoenbach, K.H.; Beebe, S.J.
Plasma Science, IEEE Transactions on
Volume 30, Issue 4, Aug 2002 Page(s): 1536 - 1546
Digital Object Identifier   10.1109/TPS.2002.804177
Summary:The temporal dynamics of electroporation of cells subjected to ultrashort voltage pulses are studied based on a coupled scheme involving the Laplace, Nernst-Planck, and Smoluchowski equations. It is shown that a finite time delay exists in pore formation, and leads to a transient overshoot of the transmembrane potential Vmem beyond 1.0 V. Pore resealing is shown to consist of an initial fast process, a 10-4 second delay, followed by a much slower closing at a time constant of about 10-1 s. This establishes a time window for effective killing by a second pulse. The results are amply supported by our experimental data for E.-coli cells, and the time constant also matches experiments. An electromechanical analysis for analyzing cell shape changes is also presented. Our calculations show that at large fields, the spherical cell geometry can be significantly modified, and even ellipsoidal forms would be inappropriate to describe the deformation. Values of surface forces obtained are in very good agreement with the 1-10-nN/m range reported for membrane rupture. It is also demonstrated that, at least for the smaller electric fields, both the cellular surface area and volume change roughly in a quadratic manner with electric field. Finally, it is shown that the bending moments are generally quite small and can be neglected for a simpler analysis.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved