Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Demodulation and tracking with dirty templates for UWB impulse radio: algorithms and performance
Farahmand, S.; Xiliang Luo; Giannakis, G.B.
Vehicular Technology, IEEE Transactions on
Volume 54, Issue 5, Sept. 2005 Page(s): 1595 - 1608
Digital Object Identifier   10.1109/TVT.2005.854032
Summary: Major challenges in ultrawideband (UWB) communications include timing acquisition, tracking, and low complexity demodulation. Timing with dirty templates (TDT) is a recently proposed acquisition algorithm with attractive features. Starting with a performance analysis of TDT, this paper goes on to considerably broaden its scope by developing novel tracking loops and detectors by naturally following the TDT operation. Specifically, upper bounds on the mean square error of the blind and data-aided TDT estimators are derived, along with TDT-based demodulators, obviating the need to know the underlying channel and time hopping code. Analytical comparisons reveal that TDT demodulators outperform RAKE with limited number of fingers in the medium-high SNR range. TDT demodulation performance in the presence of timing errors is evaluated and shown to be robust to mistiming. In order to follow timing offset variations, an adaptive loop is also introduced to track the first multipath arrival of each symbol. For a given input disturbance, parameters of the loop are selected to optimize jointly transient and steady state performance. Analytical results are corroborated by simulations.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved