Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Not just another self-consistent magnetic recording model
Hughes, G.; Bloomberg, D.; Castelli, V.; Hoffman, R.
Magnetics, IEEE Transactions on
Volume 17, Issue 2, Mar 1981 Page(s): 1192 - 1199
Digital Object Identifier  
Summary: A self-consistent magnetic recording modeling method is presented which has proven useful in recording channel design on thin media. Improvements in the magnetic model and in the mathematical treatment stabilize the iterative process and reduce computer storage requirements. Major and minor media loops are fitted to quickly computable bipolynomials. Mathematical improvements include using a strong band diagonal demagnetization matrix, analytic integration with quadratic magnetization fitting, and Newton-Raphson iteration, which gives rapid convergence without underrelaxation. Quantitative predictions of timing errors in 16-bit modified frequency modulation (MFM) data patterns on a 350-bit/mm, 20-track/mm disk memory are presented, as well as playback amplitudes and saturation currents. Predictions can also be compared with experimental read/write data to determine system parameters. Two examples are given: the inference of the head efficiency and of the effective high-frequency medium squareness.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved