Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Question: DRC or DfM? Answer: FMEA and ROI
Balasinski, A.
Quality Electronic Design, 2006. ISQED apos;06. 7th International Symposium on
Volume , Issue , 27-29 March 2006 Page(s):6 pp. - 794
Digital Object Identifier   10.1109/ISQED.2006.110
Summary:Design for manufacturability (DfM) is a design verification methodology linked to a set of requirements that can be perceived as gray area within the design rule check (DRC) approach based on rigid pass/fail criteria. This is because the DfM rules, unlike DRC, are not directly responsible for the functionality of individual devices, but are broadly scoped to address the die yield over the process corners. At the same time, all design rules are to ensure high performance and profit margins. Therefore, the distinction between DfM and DRC rules is often artificial and confusing. In this paper, we propose how to combine all design rules into one enforceable deck, regardless of their origin, and introduce an implementation cutoff lines decided by technology and business factors. This new methodology is based on the failure mode and effect analysis (FMEA) and return on investment (RoI). FMEA, involving the criticality, occurrence, and detectability of failure modes, is demonstrated for DfM rules focused on system on chip (SoC). The results are then correlated to those of the RoI approach for the same set of rules

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved