Non-linearity cancellation in MEMS resonators for improved power-handling
Agarwal, M.; Park, K.; Candler, R.; Hopcroft, M.; Jha, C.; Melamud, R.; Kim, B.; Murmann, B.; Kenny, T.W.
Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International
Volume , Issue , 5-5 Dec. 2005 Page(s):286 - 289
Digital Object Identifier   10.1109/IEDM.2005.1609330
Summary:In this work, we present mathematical analysis and experimental verification of the bifurcation limited power handling in MEMS resonators. We report useful cancellation between electrical and mechanical non-linearities. Within the scaling limits it has been found that the power handling improves for devices with larger electrode to resonator gaps. We also report an alternative method of measuring critical bifurcation using shifts in resonant frequency

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