Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

New Short-Circuit Testing Facilities to Cope With the Recent Development of GIS
Yamamoto, M.; Yamashita, S.; Ikeda, H.; Yanabu, S.
Power Apparatus and Systems, IEEE Transactions on
Volume PAS-104, Issue 1, Jan. 1985 Page(s):150 - 156
Digital Object Identifier   10.1109/TPAS.1985.318888
Summary:Short-circuit testing facilities are discussed for SF6 gas-insulated switchgear (GIS) equipment. It is shown that the supply voltage of 28kV will suffice to supply short-circuit current up to 80kA without severe distortions for four breaks used in the full voltage test of a tank-type SF6 gas circuit breaker (GCB). A new testing method using two transformers is proposed for a three-phase-in-one-tank-type GCB.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved