Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

A sampling based approach to facial feature extraction
Karthik Sridharan; Venu Govindaraju
Automatic Identification Advanced Technologies, 2005. Fourth IEEE Workshop on
Volume , Issue , 17-18 Oct. 2005 Page(s): 51 - 56
Digital Object Identifier   10.1109/AUTOID.2005.7
Summary: Facial feature extraction is considered a key step in many biometric applications. We propose a system that performs facial feature extraction in a given grey-scale face image using Hamiltonian sampling. During training stage of the proposed system, the parameters for a hybrid linear Gaussian model are learnt based on the training data. During the testing stage, when a new image is posed to the system, it uses the learnt graphical model together with hybrid (Hamiltonian) sampling to locate and extract the facial features. The system is an appearance based model which uses PPCA that is robust against noise. The modeling of correlations between latent variables by the graphical model helps in making the facial feature extraction both accurate and efficient. The use of the hybrid sampling helps in locating and extracting facial features in fewer iterations.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved