Optimal interconnect diagnosis of wiring networks
Weiping Shi; Fuchs, W.K.
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Volume 3, Issue 3, Sep 1995 Page(s):430 - 436
Digital Object Identifier   10.1109/92.407000
Summary:Interconnect diagnosis is an important problem in very large scale integration (VLSI), multichip module (MCM) and printed circuit board (PCB) production. The problem is to detect and locate all the shorts, opens and stuck-at faults among a set of nets using the minimum number of parallel tests. In this paper, we present worst-case optimal algorithms and lower bounds to several open problems in interconnect diagnosis

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