Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Silicon models of lateral inhibition
Wolpert, S.; Micheli-Tzanakou, E.
Neural Networks, IEEE Transactions on
Volume 4, Issue 6, Nov 1993 Page(s):955 - 961
Digital Object Identifier   10.1109/72.286890
Summary:The neurological process known as lateral inhibition (LI) has long been acknowledged as a critical operation for the preprocessing many types of sensory stimuli. In the mammalian retina, LI is utilized to enhance visual images by performing differential amplification on the pixels from which the image is composed. In this study, LI is implemented using VLSI-based models. These models consist of small two-dimensional arrays of generalized sensory pixels, each of which inhibits, and in turn is inhibited by, each of its immediate neighbors. Two custom CMOS array prototypes circuits have been designed, fabricated, and characterized. Test results indicate that both circuits are able to impart contrast to arbitrary two-dimensional geometric images in a flexible yet stable manner, and do so immediately and simultaneously. These arrays thus offer a level of performance not attainable by software methods, making this method well suited for machine vision systems that utilize parallel architectures

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved