Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

3-D polyhedral face computation from two perspective views with theaid of a calibration plate
Jui-Man Chiu; Zen Chen; Chao-Ming Wang
Robotics and Automation, IEEE Transactions on
Volume 13, Issue 2, Apr 1997 Page(s):290 - 295
Digital Object Identifier   10.1109/70.563650
Summary:The 3-D reconstruction of visible polyhedral faces from a pair of general perspective views with the aid of a calibration plate is addressed. A polyhedron is placed on a planar calibration plate and two side views of both the polyhedron and the calibration plate are taken. Through proper arrangements we may assume that in the two views a number of polyhedral edges lying on the calibration plate and the whole calibration plate boundary are visible. We present an online camera calibration technique with the aid of the calibration plate and a two-stage process to find the vertex/edge correspondences without encountering the ambiguity problem of the conventional epipolar line technique. We then give a closed form solution to the 3-D polyhedral vertices visible in both images. We also describe other advantages of using our method for the 3-D polyhedron reconstruction. Experimental results show that the obtained 3-D polyhedral vertex coordinates are rather accurate

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved