Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Discrete event simulation experiments and geographic informationsystems in congestion management planning
Wiley, R.B.; Keyser, T.K.
Simulation Conference Proceedings, 1998. Winter
Volume 2, Issue , 13-16 Dec 1998 Page(s):1087 - 1093 vol.2
Digital Object Identifier   10.1109/WSC.1998.745857
Summary:A regional transportation system and the movement of large traffic volumes through it, are characteristic of stochastic systems. The standard traffic management or transportation planning approach uses a slice in time view of the system. Static, mean values of system variables are used for the basis of incident-caused, congestion management decisions. By reason of the highly variable nature of transportation systems, discrete event simulation is used in the planning process. The simulation model is highly dependent on the spatial accuracy of real world coordinates of nodes and the lengths of the roadway network links. Link travel times, queue spill back and turn lane queue size are directly related to the magnitude of incident-caused congestion, and the roadway system's ability to recover from it. The incorporation of accurate geographic information system (GIS) data with a powerful transportation simulation software package and properly designed data collection and analysis techniques are invaluable in support of transportation incident management decisions

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved