Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Edge decision assisted decorrelators for asynchronous CDMA channels
Junqiang Shen; Zhi Ding
Communications, IEEE Transactions on
Volume 47, Issue 3, Mar 1999 Page(s):438 - 445
Digital Object Identifier   10.1109/26.752824
Summary:Asynchronous decorrelating detector is a linear multiuser detector in code-division multiple-access (CDMA) environment. It has relatively good performance and low-computational complexity. However, the ideal asynchronous decorrelating detector requires the observation of the entire input bit sequence. Implementation of this ideal detector based on a long bit sequence results in long delays and high computational complexity. In fact, if the observed window does not cover the entire data sequence, the classical asynchronous decorrelating detector is no longer near-far resistant. In this paper, we propose a method using initial decisions on bits for both edges of the finite observed window. These initial decisions are used to assist subsequent decisions of the whole sequence inside the observed window based on the decorrelating method. This new edge decision assisted decorrelator (EDAD) method is shown to be near-far resistant

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved