Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Berger check prediction for concurrent error detection in the Braunarray multiplier
Jones, C.M.; Dlay, S.S.; Naguib, R.G.
Electronics, Circuits, and Systems, 1996. ICECS apos;96., Proceedings of the Third IEEE International Conference on
Volume 1, Issue , 13-16 Oct 1996 Page(s):81 - 84 vol.1
Digital Object Identifier   10.1109/ICECS.1996.582691
Summary:We develop the Berger Check Symbol Prediction and report the performance benefit for the realisation of practical concurrent error detection systems. Furthermore, we show that the Berger coded Braun array multiplier can not only achieve the objective for detecting unidirectional faults but analysis has indicated an inherent ability of this prediction technique for error detection beyond the scope for which it was originally intended. In fact the coding provides error detectability for single and multiple stuck at faults. Further study suggests the performance of the Berger check prediction Braun array multiplier tends towards 100% error detectability for increasing input bit length and array dimensions. The Berger check predictive Braun array multiplier has introduced a high level of concurrent error detectability with only a minimal extension in the hardware implementation

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved