Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Fault injection into VHDL models: the MEFISTO tool
Jenn, E.; Arlat, J.; Rimen, M.; Ohlsson, J.; Karlsson, J.
Fault-Tolerant Computing, 1994. FTCS-24. Digest of Papers., Twenty-Fourth International Symposium on
Volume , Issue , 15-17 Jun 1994 Page(s):66 - 75
Digital Object Identifier   10.1109/FTCS.1994.315656
Summary:This paper focuses on the integration of the fault injection methodology within the design process of fault-tolerant systems. Due to its wide spectrum of application and hierarchical features, VHDL has been selected as the simulation language to support such an integration. Suitable techniques for injecting faults into VHDL models are identified and depicted. Then, the main features of the MEFISTO environment aimed at supporting these techniques are described. Finally, some preliminary results obtained with MEFISTO are presented and analyzed

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved