Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Implementing high integrity systems: the VIPER microprocessor
Cullyer, W.J.
Computer Assurance, 1988. COMPASS apos;88
Volume , Issue , 27 Jun-1 Jul 1988 Page(s):56 - 66
Digital Object Identifier   10.1109/CMPASS.1988.9638
Summary:The development of VIPER, a 32-bit microprocessor, is described. Some of the practical problems encountered over the four years of the project are pointed out. Informal proofs of correctness carried out by the Royal Signals and Radar Establishment (RSRE) in the early stages of the project are outlined. It is demonstrated that current methods of hardware verification for synchronous circuits are mature enough to be used for practical problems on the scale of a simple 32-bit microprocessor

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved