Optimal spare allocation for defect-tolerant VLSI
Shi, W.; Fuchs, W.K.
Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on
Volume , Issue , 22-24 Jan 1992 Page(s):193 - 199
Digital Object Identifier   10.1109/ICWSI.1992.171811
Summary:The authors study the problem of allocating spares to specific fault-tolerant VLSI/WSI (wafer scale integration) designs to maximize the global yield. Four problems are examined: (1) the optimal yield problem for k-out-of-n systems; (2) the optimal partition of elements; (3) spare allocation for trees; and (4) spare allocations for row/column reconfiguration systems

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