Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Surface reconstruction using deformable models with interior andboundary constraints
Wang, Y.F.; Wang, J.-F.
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume 14, Issue 5, May 1992 Page(s):572 - 579
Digital Object Identifier   10.1109/34.134061
Summary:The authors introduce a technique for 3D surface reconstruction using elastic deformable-models. The model used is an imaginary elastic grid, which is made of membranous, thin-plate-type material. The elastic grid can bent, twisted, compressed, and stretched into any desired 3D shape, which is specified by the shape constraints derived automatically from images of a real 3D object. Shape reconstruction is guided by a set of imaginary springs that enforce the consistency in the position, orientation, and/or curvature measurements of the elastic grid and the desired shape. The dynamics of a surface reconstruction process is regulated by Hamilton's principle or the principle of the least action. Furthermore, a 1D deformable template that borders the elastic grid may be used. This companion boundary template is attracted/repelled by image forces to conform with the silhouette of the imaged object. Implementation results using simple analytic shapes and images of real objects are presented

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved