Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

A formal semantics for object model diagrams
Bourdeau, R.H.; Cheng, B.H.C.
Software Engineering, IEEE Transactions on
Volume 21, Issue 10, Oct 1995 Page(s):799 - 821
Digital Object Identifier   10.1109/32.469459
Summary:Informal software development techniques, such as the object modeling technique (OMT), provide the user with easy to understand graphical notations for expressing a wide variety of concepts central to the presentation of software requirements. OMT combines three complementary diagramming notations for documenting requirements: object models, dynamic models, and functional models. OMT is a useful organizational tool in the requirements analysis and system design processes. Currently, the lack of formality in OMT prevents the evaluation of completeness, consistency, and content in requirements and design specifications. A formal method is a mathematical approach to software development that begins with the construction of a formal specification describing the system under development. However, constructing a formal specification directly from a prose description of requirements can be challenging. The paper presents a formal semantics for the OMT object model notations, where an object model provides the basis for the architecture of an object oriented system. A method for deriving modular algebraic specifications directly from object model diagrams is described. The formalization of object models contributes to a mathematical basis for deriving system designs

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved