Dynamic, polarization, and transverse mode characteristics ofvertical cavity surface emitting lasers
Chang-Hasnain, C.J.; Harbison, J.P.; Hasnain, G.; Von Lehmen, A.C.; Florez, L.T.; Stoffel, N.G.
Quantum Electronics, IEEE Journal of
Volume 27, Issue 6, Jun 1991 Page(s):1402 - 1409
Digital Object Identifier   10.1109/3.89957
Summary:The dynamic, polarization, and transverse mode characteristics of strained InGaAs-GaAs quantum well vertical cavity surface emitting lasers (VCSELs) emitting at 0.98 μm are investigated. The dynamic behavior of VCSELs with high and low operating voltages and series resistances is compared. A large wavelength chirp in the lasing spectrum was observed for the lasers with high voltage/resistance, even under low-duty-cycle pulse operation. This is thought to be due to resistive heating close to the laser junction. It is observed that the transverse mode structure of VCSELs and their dependence on laser dimensions and drive current are highly analogous to those of edge emitting lasers, whereas the polarization characteristics of the two types of lasers are significantly different

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