Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

The implications of three-dimensional mesh generation on thecalculation of mechanical forces in magnetic devices
Lowther, D.A.; Forghani, B.; McFee, S.
Magnetics, IEEE Transactions on
Volume 26, Issue 5, Sep 1990 Page(s):2777 - 2779
Digital Object Identifier   10.1109/20.104870
Summary:The implications of the methods used in mesh generation for force calculation in three-dimensional magnetic device analysis are discussed. Virtual-work and single-solution methods are compared, and the usefulness of the element topological information is considered. It is concluded that because the virtual work approach is somewhat independent of the meshing system used and the coenergy values may be derived easily in the solution process, the approach may be the method of choice for many applications requiring low-cost force calculation in three dimensions. It must be noted, however, that it can generate large errors, and the exact method of generating the models for the multiple solutions, i.e., moving nodes or changing labels, can have major effects on the overall accuracy. In general, it is more difficult to separate postprocessing functions in three dimensions from the underlying topological structures created in the postprocessor and solver, and further work in both areas is needed to develop effective calculation techniques

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved