Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

The use of maximum likelihood estimation for forming images ofdiffuse radar targets from delay-Doppler data
Snyder, D.L.; Oapos;Sullivan, J.A.; Miller, M.I.
Information Theory, IEEE Transactions on
Volume 35, Issue 3, May 1989 Page(s):536 - 548
Digital Object Identifier   10.1109/18.30975
Summary:An approach to high-resolution imaging that starts with a model of the radar echo signal derived from the physics governing radar reflections is presented. The model has been used in the past to describe radar targets that are rough compared to the wavelength of the transmitted radiation. Without specifying precisely what the transmitted signal is, a general estimation-based procedure is derived for obtaining images. After discretizing the model, the radar imaging problem reduces to the task of estimating discretized second-order statistics of the reflectance process of the target. Maximum-likelihood estimates of these statics are obtained as the limit point of an expectation-maximization algorithm

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved