A new leakage-tolerant design for high fan-in domino circuits

In this paper, a new leakage-tolerant circuit design technique for high fan-in domino circuits is presented. This technique uses stacking effect to reduce the leakage of the evaluation network of domino gates. It also uses a current mirror in parallel with the evaluation network to reduce the evaluation delay. Depending on the fan-in, the proposed technique exhibits 2.0X to 17.7X leakage and noise tolerance improvement compared to a standard domino counterparts designed in a 70-nm technology node.