Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Scale-invariant shape features for recognition of object categories
Jurie, F.; Schmid, C.
Computer Vision and Pattern Recognition, 2004. CVPR 2004. Proceedings of the 2004 IEEE Computer Society Conference on
Volume 2, Issue , 27 June-2 July 2004 Page(s): II-90 - II-96 Vol.2
Digital Object Identifier   10.1109/CVPR.2004.1315149
Summary: We introduce a new class of distinguished regions based on detecting the most salient convex local arrangements of contours in the image. The regions are used in a similar way to the local interest points extracted from gray-level images, but they capture shape rather than texture. Local convexity is characterized by measuring the extent to which the detected image contours support circle or arc-like local structures at each position and scale in the image. Our saliency measure combines two cost functions defined on the tangential edges near the circle: a tangential-gradient energy term, and an entropy term that ensures local support from a wide range of angular positions around the circle. The detected regions are invariant to scale changes and rotations, and robust against clutter, occlusions and spurious edge detections. Experimental results show very good performance for both shape matching and recognition of object categories.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved